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Nanocrystalline grains in Pd thin films imaged with high resolution automated crystal orientation and phase mapping combined with transmission electron miscroscopy. Image by A. Kobler and C. Kübel, KIT. [Jochen Lohmiller, Rudolf Baumbusch, Oliver Kraft, and Patric A. Gruber, Phys. Rev. Lett. 110, 066101 (2013)] |
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