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Scanning electron microscope images of silicon bilenses carefully designed to create a novel type of x-ray interferometer. [A. Snigirev, I. Snigireva, V. Kohn, V. Yunkin, S. Kuznetsov, M. B. Grigoriev, T. Roth, G. Vaughan, and C. Detlefs, Phys. Rev. Lett. 103, 064801 (2009)] |
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